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UID:news604@physik.unibas.ch
DTSTAMP;TZID=Europe/Zurich:20230208T114605
DTSTART;TZID=Europe/Zurich:20221004T150000
SUMMARY:PhD defense of Yaoxuan Feng
DESCRIPTION:Magnetic force microscopy with high resolution and high sensiti
 vity: Quantitative approach and applications to thin film multilayer syste
 ms supporting skyrmions
X-ALT-DESC:Magnetic force microscopy with high resolution and high sensitiv
 ity: Quantitative approach and applications to thin film multilayer system
 s supporting skyrmions
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